• Title of article

    Alpha 21164 Manufacturing Test Development and Coverage Analysis

  • Author/Authors

    Carol J. Stolicny، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    7
  • From page
    98
  • To page
    104
  • Abstract
    To meet the challenge of creating test vectors for the Alpha 21164 microprocessor, Compaqʹs engineers describe a test generation and grading scheme that solves time-to-market, quality and cost concerns
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    1998
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431204

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431204