Title of article :
Online BIST for Embedded Systems
Author/Authors :
Hussain Al-Asaad Brian T. Murray John P. Hayes ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
8
From page :
17
To page :
24
Abstract :
Embedded systems must meet increasingly high expectations of safety and high reliability. The authors survey online-testing techniques for identifying faults that can lead to system failure. They focus on online built-in self-test and its role in a comprehensive testing approach
Journal title :
IEEE Design and Test of Computers
Serial Year :
1998
Journal title :
IEEE Design and Test of Computers
Record number :
431210
Link To Document :
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