Title of article
Online BIST for Embedded Systems
Author/Authors
Hussain Al-Asaad Brian T. Murray John P. Hayes ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
8
From page
17
To page
24
Abstract
Embedded systems must meet increasingly high expectations of safety and high reliability. The authors survey online-testing techniques for identifying faults that can lead to system failure. They focus on online built-in self-test and its role in a comprehensive testing approach
Journal title
IEEE Design and Test of Computers
Serial Year
1998
Journal title
IEEE Design and Test of Computers
Record number
431210
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