Title of article
Online Current Testing
Author/Authors
Jien-Chung Lo، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
8
From page
49
To page
56
Abstract
Testing professionals must choose the online VLSI testing technique most suitable for mission goals with respect to design complexity, fault coverage, safety level, and product value. Online current testing techniques provide potential solutions to reliability problems in a wide spectrum of fault-tolerant applications
Journal title
IEEE Design and Test of Computers
Serial Year
1998
Journal title
IEEE Design and Test of Computers
Record number
431214
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