Title of article :
Online Current Testing
Author/Authors :
Jien-Chung Lo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
8
From page :
49
To page :
56
Abstract :
Testing professionals must choose the online VLSI testing technique most suitable for mission goals with respect to design complexity, fault coverage, safety level, and product value. Online current testing techniques provide potential solutions to reliability problems in a wide spectrum of fault-tolerant applications
Journal title :
IEEE Design and Test of Computers
Serial Year :
1998
Journal title :
IEEE Design and Test of Computers
Record number :
431214
Link To Document :
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