Abstract :
The programmable BIST design presented here supports various test modes using a simple controller. With the March C algorithm, the BIST circuitʹs overhead is under 1.3% for a 1-Mbit DRAM and under 0.3% for a 16-Mbit DRAM. The BIST design presented for embedded DRAM supports built-in self-diagnosis by feeding error information to the external tester. Moreover, using a specific test sequence, it can test for critical timing faults, reducing tester time for ac parametric test. The design supports wafer test, pre-burn-in test, burn-in, and final test. It is field-programmable; the user can program test algorithms using predetermined test elements (such as march elements, surround test elements, and refresh modes). The user can optimize the hardware for a specific embedded DRAM with a set of predetermined test elements. Our design is different from the microprogram-controlled BIST described by J. Dreibelbis et al. (1998) which has greater flexibility but higher overhead. Because our design begins at the register-transfer language level, test element insertion (for higher test coverage) and deletion (for lower hardware overhead are relatively easy
