Title of article :
Test and Reliability: Partners in IC Manufacturing, Part 1
Author/Authors :
Charles F. Hawkins
Jaume Segura
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
This article explains the major IC reliability failure mechanisms with perspectives on their severity and relation to test
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
