Title of article
Hierarchical Design and Test of Integrated Microsystems
Author/Authors
Tamal Mukherjee، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
10
From page
18
To page
27
Abstract
This article presents emerging results of an integrated mixed-domain design methodology similar to the mixed-signal design methodologies in the VLSI community. This methodology is based on a hierarchical mixed-domain design representation and includes a Spice-like nodal simulation environment, an “on-the-fly” component layout-synthesis module, a layout extractor for design verification, and a fault model generator for test methodology development
Journal title
IEEE Design and Test of Computers
Serial Year
1999
Journal title
IEEE Design and Test of Computers
Record number
431253
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