Title of article :
Hierarchical Design and Test of Integrated Microsystems
Author/Authors :
Tamal Mukherjee، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
This article presents emerging results of an integrated mixed-domain design methodology similar to the mixed-signal design methodologies in the VLSI community. This methodology is based on a hierarchical mixed-domain design representation and includes a Spice-like nodal simulation environment, an “on-the-fly” component layout-synthesis module, a layout extractor for design verification, and a fault model generator for test methodology development
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers