• Title of article

    Hierarchical Design and Test of Integrated Microsystems

  • Author/Authors

    Tamal Mukherjee، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    10
  • From page
    18
  • To page
    27
  • Abstract
    This article presents emerging results of an integrated mixed-domain design methodology similar to the mixed-signal design methodologies in the VLSI community. This methodology is based on a hierarchical mixed-domain design representation and includes a Spice-like nodal simulation environment, an “on-the-fly” component layout-synthesis module, a layout extractor for design verification, and a fault model generator for test methodology development
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    1999
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431253