Title of article :
On the Integration of Design and Test for Chips Embedding MEMS
Author/Authors :
Salvador Mir
Benoit Charlot
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
This article illustrates how fault-based, defect-oriented test approaches can be applied to the problem of testing the next generation of chips embedding MEMS
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
