Title of article
A Reliability Testing Environment for Off-the-Shelf Memory Subsystems
Author/Authors
Seung H. Hwang Gwan S. Choi ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
9
From page
116
To page
124
Abstract
A cyclotron-based radiation test environment enables engineers to characterize the soft-error sensitivity of memory subsystems and assess its impact at the system level. Device/circuit modeling and simulation assist the radiation experiments in detecting device-level single-event upsets
Journal title
IEEE Design and Test of Computers
Serial Year
2000
Journal title
IEEE Design and Test of Computers
Record number
431300
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