Title of article :
Test Development for a Third-Version ColdFire Microprocessor
Author/Authors :
Alfred L. Crouch، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The design-for-test methodology of the MCF5307 device is described, illustrating issues faced, how solutions were derived, and results
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
