Title of article :
Collection and Analysis of Microprocessor Design Errors
Author/Authors :
David Van Campenhout
Trevor Mudge
John P. Hayes
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
Research on practical design verification techniques has long been impeded by the lack of published, detailed error data. We have systematically collected design error data over the last few years from a number of academic microprocessor design projects. We analyzed this data and report on the lessons learned in the collection effort
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers