Title of article :
Collection and Analysis of Microprocessor Design Errors
Author/Authors :
David Van Campenhout Trevor Mudge John P. Hayes ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
10
From page :
51
To page :
60
Abstract :
Research on practical design verification techniques has long been impeded by the lack of published, detailed error data. We have systematically collected design error data over the last few years from a number of academic microprocessor design projects. We analyzed this data and report on the lessons learned in the collection effort
Journal title :
IEEE Design and Test of Computers
Serial Year :
2000
Journal title :
IEEE Design and Test of Computers
Record number :
431308
Link To Document :
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