Title of article :
Postsilicon Validation Methodology for Microprocessors
Author/Authors :
Hemant Rotithor، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
12
From page :
77
To page :
88
Abstract :
A proposed methodology targets microarchitectural attributes prioritized based on the importance of validating corner cases. Several test templates cover all the critical attributes
Journal title :
IEEE Design and Test of Computers
Serial Year :
2000
Journal title :
IEEE Design and Test of Computers
Record number :
431310
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431310
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