Title of article
Guest Editorsʹ Introduction: Defect-Oriented Diagnosis for Very Deep-Submicron Systems
Author/Authors
Fabrizio Lombardi Cecilia Metra ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
2
From page
8
To page
9
Journal title
IEEE Design and Test of Computers
Serial Year
2001
Journal title
IEEE Design and Test of Computers
Record number
431313
Link To Document