Title of article
Fault Detection and Location Using IDD Waveform Analysis
Author/Authors
Khurram Muhammad Kaushik Roy ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
8
From page
42
To page
49
Abstract
This paper shows that IDD waveform analysis can detect defects that IDDQ testing cannot. An investigation of IDD waveform analysis methods-one based on integrators, one on fast Fourier transform-confirms that such analysis enables fault localization testing in static and dynamic CMOS circuits
Journal title
IEEE Design and Test of Computers
Serial Year
2001
Journal title
IEEE Design and Test of Computers
Record number
431317
Link To Document