• Title of article

    IC Diagnosis Using Multiple Supply Pad IDDQs

  • Author/Authors

    Jim Plusquellic، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    12
  • From page
    50
  • To page
    61
  • Abstract
    An IDDQ technique is proposed based on an extension of a VDDT-based method called transient signal analysis. The method, called quiescent signal analysis, uses IDDQs measured at multiple supply pins as a means of localizing defects
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2001
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431318

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431318