• Title of article

    Current-Based Testing for Deep-Submicron VLSIs

  • Author/Authors

    Manoj Sachdev، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    9
  • From page
    76
  • To page
    84
  • Abstract
    Current-based testing for deep-submicron VLSIs is important because of transistor sensitivity to defects as technology scales. However, unabated increases in leakage current in CMOS devices can make this testing very difficult. This article offers several solutions to this challenging problem
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2001
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431329

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431329