Title of article :
Design and Test of Large Embedded Memories: An Overview
Author/Authors :
Rochit Rajsuman Francky Catthoor ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
12
From page :
16
To page :
27
Abstract :
Large on-chip memories are desirable but difficult to implement. Challenges range from design automation to fabrication to test algorithms and memory redundancy and repair
Journal title :
IEEE Design and Test of Computers
Serial Year :
2001
Journal title :
IEEE Design and Test of Computers
Record number :
431334
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431334
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