Title of article :
Using Electrical Bitmap Results from Embedded Memory to Enhance Yield
Author/Authors :
Julie Segal
Alvin Jee
David Lepejian
Ben Chu
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
Analyzing bitmap results can provide insight into physical failure mechanisms normally acquired only through the complex, time-consuming, and expensive process of failure analysis
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
