Title of article
Using Electrical Bitmap Results from Embedded Memory to Enhance Yield
Author/Authors
Julie Segal Alvin Jee David Lepejian Ben Chu ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
12
From page
28
To page
39
Abstract
Analyzing bitmap results can provide insight into physical failure mechanisms normally acquired only through the complex, time-consuming, and expensive process of failure analysis
Journal title
IEEE Design and Test of Computers
Serial Year
2001
Journal title
IEEE Design and Test of Computers
Record number
431335
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