Title of article :
Economics of Built-in Self-Tes
Author/Authors :
Louis Y. Ungar Tony Ambler ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
10
From page :
70
To page :
79
Abstract :
Using built-in self-test at the right level offers users significant cost savings, but determining which level, if any, is best for BIST can be complex. A detailed economic analysis can unravel heterogeneous costs and benefits so that designers and managers can make the right decision
Journal title :
IEEE Design and Test of Computers
Serial Year :
2001
Journal title :
IEEE Design and Test of Computers
Record number :
431358
Link To Document :
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