Title of article :
Economics of Built-in Self-Tes
Author/Authors :
Louis Y. Ungar
Tony Ambler
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
Using built-in self-test at the right level offers users significant cost savings, but determining which level, if any, is best for BIST can be complex. A detailed economic analysis can unravel heterogeneous costs and benefits so that designers and managers can make the right decision
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers