Title of article
Test Resource Partitioning for SOCs
Author/Authors
Anshuman Chandra Krishnendu Chakrabarty ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
12
From page
80
To page
91
Abstract
A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test duality
Journal title
IEEE Design and Test of Computers
Serial Year
2001
Journal title
IEEE Design and Test of Computers
Record number
431359
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