• Title of article

    IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions

  • Author/Authors

    Zhanping Chen، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    10
  • From page
    24
  • To page
    33
  • Abstract
    The use of low-threshold devices in scaled low-voltage CMOS circuits leads to increased intrinsic leakage current. As a result, I DDQ testing requires different techniques to remain effective
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2002
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431379

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431379