Title of article
Survey of Low-Power Testing of VLSI Circuits
Author/Authors
Patrick Girard، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
11
From page
82
To page
92
Journal title
IEEE Design and Test of Computers
Serial Year
2002
Journal title
IEEE Design and Test of Computers
Record number
431391
Link To Document