Title of article :
Guest Editorsʹ Introduction: Defect-Oriented Testing in the Deep-Submicron Era
Author/Authors :
Jaume Segura
Peter Maxwell
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
