Title of article
IDDQ Test: Will It Survive the DSM Challenge?
Author/Authors
Sagar S. Sabade D.M.H. Walker ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
9
From page
8
To page
16
Abstract
Deep-submicron technologies pose difficult challenges for IDDQ testing in the future. The low threshold voltage used by DSM devices decreases the defect resolution of IDDQ. However, because IDDQ is a valuable test method, researchers are working to augment with other test parameters to prolong its effectiveness
Journal title
IEEE Design and Test of Computers
Serial Year
2002
Journal title
IEEE Design and Test of Computers
Record number
431409
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