• Title of article

    Resistance Characterization for Weak Open Defects

  • Author/Authors

    Rosa Rodriguez Montanes، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    9
  • From page
    18
  • To page
    26
  • Abstract
    Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2002
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431410

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431410