Title of article :
Guest Editorsʹ Introduction: Design for Yield and Reliability
Author/Authors :
Yervant Zorian، نويسنده , , Virage Logic Dimitris Gizopoulos، نويسنده , , University of Piraeus Cary Vandenberg، نويسنده , , HPL Technologies Philippe Magarshack، نويسنده , , STMicroelectronics ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
6
From page :
177
To page :
182
Journal title :
IEEE Design and Test of Computers
Serial Year :
2004
Journal title :
IEEE Design and Test of Computers
Record number :
431493
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=431493
