Title of article :
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure
Author/Authors :
Samvel Shoukourian، نويسنده , , Virage Logic
Valery Vardanian، نويسنده , , Virage Logic
Yervant Zorian، نويسنده , , Virage Logic
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
Today, embedded memories are the most important contributor to SoC yield. To maximize embedded-memory yield, advanced test and repair solutions must be an integral part of the memory block. We analyze factors that affect memory yield and presents advanced techniques for maximizing the positive impact.
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
