Title of article :
An Automatic Technique for Optimizing Reed-Solomon Codes to Improve Fault Tolerance in Memories
Author/Authors :
State University of Rio Grande do Sul Gustavo Neuberger، نويسنده , , Federal University of Rio Grande do Sul Fernanda Gusmao de Lima Kastensmidt، نويسنده , , Federal University of Rio Grande do Sul Ricardo Reis، نويسنده , , Federal University of Rio Grande do Sul ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
9
From page :
50
To page :
58
Abstract :
Modern SoC architectures manufactured at ever-decreasing geometries use multiple embedded memories. Error detection and correction codes are becoming increasingly important to improve the fault tolerance of embedded memories. This article focuses on automatically optimizing classical Reed-Solomon codes by selecting the appropriate code polynomial and set of used symbols.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2005
Journal title :
IEEE Design and Test of Computers
Record number :
431554
Link To Document :
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