Title of article :
A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies
Author/Authors :
Chen He، نويسنده , , University of Texas at Austin and Freescale Semiconductor Inc. Margarida F. Jacome، نويسنده , , University of Texas at Austin Gustavo de Veciana، نويسنده , , University of Texas at Austin ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
11
From page :
316
To page :
326
Abstract :
This article discusses a novel probabilistic design paradigm targeting reconfigurable architected nanofabrics and points to a promising foundation for comprehensively addressing, at the system level, the density, scalability, and reliability challenges of emerging nanotechnologies. The approach exposes a new class of yield, delay, and cost trade-offs that must be jointly considered when designing computing systems in defect-prone nanotechnologies.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2005
Journal title :
IEEE Design and Test of Computers
Record number :
431592
Link To Document :
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