Whatʹs the problem?

Most readers of IEEE Design & Test are IC people. We IC people have been running scared our entire careers. On the test side, at least, weʹve been sure that the next process node, the next tenfold increase in gate and transistor count, will break our tools and create a set of defects that we donʹt know how to test. Disaster is always just around the corner. We hope that new techniques, like IDDQ and N-detect test, will save us from the scary new defects.