Title of article
Bridging the Processor-Memory Performance Gapwith 3D IC Technology
Author/Authors
Christianto C. Liu، نويسنده , , Cornell University Ilya Ganusov، نويسنده , , Cornell University Martin Burtscher، نويسنده , , Cornell University Sandip Tiwari، نويسنده , , Cornell University ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
9
From page
556
To page
564
Abstract
The theme of the 2005 International Test Conference is “Test: Survival of the Fittest.” In conjunction with this yearʹs ITC, this special section examines how test helps the fittest of the industryʹs chips, boards, and systems survive manufacturing to reach its customers. These articles discuss topics such as X-tolerant test response compaction, reducing yield loss using a constrained ATPG, and using IDDQ testing with todayʹs high background currents.
Journal title
IEEE Design and Test of Computers
Serial Year
2005
Journal title
IEEE Design and Test of Computers
Record number
431624
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