Title of article
Designing "Vary" Good Circuitry
Author/Authors
Sachin Sapatnekar، نويسنده , , University of Minnesota، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
2
From page
596
To page
597
Abstract
Statistical Analysis and Optimization for VLSI: Timing and Power, by Ashish Srivastava, Dennis Sylvester, and David Blaauw (Springer, 2005, ISBN 0-38-725738-1, 279 pp., $129). Variation-tolerant techniques based on statistical design have been the focus of intense research over the past few years. This book is the first detailed survey of developments in this field; it is an excellent resource for anyone interested in learning about the topic, as well as a practitioner or researcher seeking a quick reference. Users of statistical analysis and optimization CAD tools will find it invaluable because it provides the background required to separate the wheat from the chaff.
Journal title
IEEE Design and Test of Computers
Serial Year
2005
Journal title
IEEE Design and Test of Computers
Record number
431629
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