Title of article :
Dealing with Early Life Failures
Author/Authors :
Kwang-Ting (Tim) Cheng، نويسنده , , University of California، نويسنده , , Santa Barbara، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Abstract :
D&T editor in chief Tim Cheng discusses the industryʹs struggle to screen latent defects for complex ICs. He also welcomes two new editors to the D&T editorial board.
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
