Title of article :
DAC Highlights
Author/Authors :
Sachin Sapatnekar، نويسنده , , University of Minnesota Grant Martin، نويسنده , , Tensilica، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
3
From page :
182
To page :
184
Abstract :
The 43rd Design Automation Conference presents leading-edge industry practices and academic research across IC, embedded-systems, and "beyond the die" design technologies and methodologies. The authors discuss the highlights, from keynote talks by reknowned personalities in the semiconductor industry to hands-on tutorials.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2006
Journal title :
IEEE Design and Test of Computers
Record number :
431659
Link To Document :
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