Author/Authors :
Vincent Kerzérho، نويسنده , , Philips Semiconductors and LIRMM
Philippe Cauvet، نويسنده , , Philips Semiconductors
Serge Bernard، نويسنده , , LIRMM
Florence Azaïs، نويسنده , , LIRMM
Mariane Comte، نويسنده , , LIRMM
Michel Renovell، نويسنده , , LIRMM
، نويسنده ,
Abstract :
Testing mixed-signal circuits remains one of the most difficult challenges within the semiconductor industry. In this article, the authors present a novel DFT technique to test sets of ADCs and DACs embedded in a complex SiP. The technique provides fully digital testing on the converters to significantly reduce the cost of testing
