Title of article :
Guest Editorʹs Introduction: ITC Helps Get More Out of Test
Author/Authors :
Kenneth M. Butler، نويسنده , , Texas Instruments، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
2
From page :
388
To page :
389
Abstract :
This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2006
Journal title :
IEEE Design and Test of Computers
Record number :
431686
Link To Document :
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