Title of article :
Computer-Aided Design and Test for Digital Microfluidics
Author/Authors :
Fei Su، نويسنده , , Intel Jun Zeng، نويسنده , , Coventor ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
11
From page :
60
To page :
70
Abstract :
This article discusses several aspects of design and test methodology centered on digital microfluidics, including modeling, simulation, synthesis, test, and reconfiguration. The automated design methods for digital electronics and adaption of them to droplet-based microfluidics are explained. The test methodology detects both catastrophic and parametric faults by electrically controlling and tracking the motion of the test stimuli droplets and also facilitates concurrent testing, in which fault testing and biomedical assays run simultaneously on a microfluidic system.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2007
Journal title :
IEEE Design and Test of Computers
Record number :
431711
Link To Document :
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