Title of article :
Economic Aspects of Memory Built-in Self-Repair
Author/Authors :
Rei-Fu Huang، نويسنده , , Media Tek Chao-Hsun Chen، نويسنده , , National Tsing Hua University Cheng-Wen Wu، نويسنده , , National Tsing Hua University ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
9
From page :
164
To page :
172
Abstract :
With the advent of deep-submicron technology and SoC design methodology, itʹs possible to integrate heterogeneous cores from different sources in a single chip containing millions of gates. The yield of such a large chip is usually too low to be profitable. Therefore, yield enhancement is an important issue in SoC product development. Memory cores usually occupy a large proportion of the area of a typical SoC, and they normally have higher circuit density, so they tend to dominate SoC yield. This article presents cost and benefit models to evaluate the economic effectiveness of typical memory BISR implementations. Experimental results with a simulator based on these cost models show that memory size impacts cost-effectiveness more than production volume does.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2007
Journal title :
IEEE Design and Test of Computers
Record number :
431727
Link To Document :
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