Title of article
A Production IR-Drop Screen on a Chip
Author/Authors
Zahi Abuhamdeh، نويسنده , , TranSwitch Bob Hannagan، نويسنده , , TranSwitch Jeff Remmers، نويسنده , , Plexus Design Solutions Alfred L. Crouch، نويسنده , , Inovys ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
9
From page
216
To page
224
Abstract
Many modern designs have large, localized failures due to excessive power consumption, which can be measured as IR drop. The methodology described here employs an on-chip process-monitoring circuit that is easy to integrate on chip and use in a characterization or production environment, to help identify and localize IR-drop hot spots and power-related failures.
Journal title
IEEE Design and Test of Computers
Serial Year
2007
Journal title
IEEE Design and Test of Computers
Record number
431737
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