• Title of article

    Leakage Minimization Technique for Nanoscale CMOS VLSI

  • Author/Authors

    Kyung Ki Kim، نويسنده , , Northeastern University Yong-Bin Kim، نويسنده , , Northeastern University Minsu Choi، نويسنده , , University of Missouri-Rolla Nohpill Park، نويسنده , , Oklahoma State University، نويسنده , , Stillwater ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2007
  • Pages
    9
  • From page
    322
  • To page
    330
  • Abstract
    Because of the continued scaling of technology and supply-threshold voltage, leakage power has become more significant in power dissipation of nanoscale CMOS circuits. Therefore, estimating the total leakage power is critical to designing low-power digital circuits. In nanometer CMOS circuits, the main leakage components are the subthreshold, gate-tunneling, and reverse-biased junction band-to-band-tunneling (BTBT) leakage currents.
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2007
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    431753