Title of article :
The Psychology of Electronic Test
Author/Authors :
Scott Davidson، نويسنده , , Sun Microsystems Helen Davidson، نويسنده , , Davidson Decision Resources ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
8
From page :
494
To page :
501
Abstract :
Test-related decisions have important consequences for product cost, quality, reliability, and information gathering. Yet, the persons making those decisions are - like all of us - imperfect. This article suggests ways to improve our understanding of our own decision making with an eye toward making the best choices possible in the area of electronic test.
Journal title :
IEEE Design and Test of Computers
Serial Year :
2007
Journal title :
IEEE Design and Test of Computers
Record number :
431774
Link To Document :
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