Title of article
DATE 07 workshop on diagnostic services in NoCs
Author/Authors
Krishnendu Chakrabarty Erik Jan Marinissen ، نويسنده , , NXP Research Axel Jantsch، نويسنده , , KTH Stockholm Nicola Nicolici، نويسنده , , McMaster University ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
1
From page
510
To page
510
Abstract
The Workshop on Diagnostic Services in Network-on-Chips, held during DATE 2007, focused on test, debugging, and online monitoring in NoCs. The main body of the workshop was formed by two sessions with full-length paper presentations and two lively poster sessions with a total of 28 posters. EPFLʹs Giovanni De Micheli gave the keynote address, and the workshop also featured a panel session led by Tensilicaʹs Grant Martin and invited talks by Virage Logicʹs Yervant Zorian and NXP Semiconductorsʹ Kees Goossens. The workshop produced electronic online proceedings, including papers, slides, and posters-totaling 420 pages.
Journal title
IEEE Design and Test of Computers
Serial Year
2007
Journal title
IEEE Design and Test of Computers
Record number
431778
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