Author/Authors :
Nektarios Kranitis
، نويسنده , , University of Athens
Andreas Merentitis، نويسنده , , University of Athens
George Theodorou، نويسنده , , University of Athens
Antonis Paschalis، نويسنده , , University of Athens
Dimitris Gizopoulos، نويسنده , , University of Piraeus
Cary Vandenberg، نويسنده ,
Abstract :
In this article, we introduce a hybrid-SBST methodology for efficient testing of commercial processor cores that effectively uses the advantages of various SBST methodologies. Self-test programs based on deterministic structural SBST methodologies combined with verification-based self-test code development and directed RTPG constitute a very effective H-SBST test strategy. The proposed methodology applies directed RTPG as a supplement to improve overall fault coverage results after component-based self-test code development has been performed.
