Title of article
Effect of temperature annealing on capacitive and structural properties of hydrous ruthenium oxides
Author/Authors
Wei-Chuan Fang، نويسنده , , Jin-Hua Huang، نويسنده , , Li-Chyong Chen، نويسنده , , Yuh-Long Oliver Su، نويسنده , , Kuei-Hsien Chen، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
5
From page
1506
To page
1510
Abstract
The structure–property relationships of hydrous ruthenium oxides, fabricated by electro deposition on Ti foil, were investigated with different annealing conditions. The annealing temperature was found to play an important role in affecting the electrochemical performance of the annealed hydrous ruthenium oxides. The results indicate that annealing hydrous ruthenium oxide at its crystallization threshold temperature, ~200 °C, may help to create suitable nanostructure in the oxide that supports the establishment of interpenetrating percolation paths for balanced electron and proton conduction, thereby improving the capacitive response of the oxide dramatically. This finding is useful for fabrication of electrodes with enhanced electrochemical performance for application in microsupercapacitor.
Keywords
Supercapacitor , Hydrous ruthenium oxides , Annealing effect
Journal title
Journal of Power Sources
Serial Year
2006
Journal title
Journal of Power Sources
Record number
438060
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