Open-circuit voltage recovery of nickel/cadmium cells

Destructive study of nickel/cadmium cells is generally a preferred method of measuring cell degradation. The voltage recovery of these cells at a low state-of-charge has been in use as an acceptance test, even though efforts to correlate the cell voltage to degradation mechanisms have not been successful. In this study, the shape of the cell voltage recovery curve is correlated with the capacity-limiting electrode. It is shown that voltage recovery can give useful information of soft shorts in nickel/cadmium cells.