Title of article
Failure of a thin film due to inclusions on the interface
Author/Authors
Pei Gu، نويسنده , , Wei Yang، نويسنده , , C. F. Shih، نويسنده , , R. J. Asaro، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
19
From page
949
To page
967
Abstract
This paper addresses failures near irregularities on the interface between a film and a
substrate. Several boundary value problems, including two-dimensional and three-dimensional
problems, involving inclusions of various shapes placed on the interface, are considered. The loading
is induced by the lattice parameter mismatch between the film and substrate. Stresses near the
interface and the inclusion boundary are of particular interest. The solutions show stress concentration
around the inclusion boundary ; in fact, a logarithmic singularity exists at the intersection
of the inclusion, film and substrate. Emphasis is placed on identifying failures associated with high
stresses near the inclusion. A theoretical prediction of the misfit strain to cause adhesion failure is
obtained. The driving force for dislocation emission from the inclusion is calculated, and it is shown
that dislocation emission from inclusions is favoured under a sufficiently large misfit strain. © 1997,
Elsevier Science Ltd. All rights reserved
Journal title
International Journal of Solids and Structures
Serial Year
1997
Journal title
International Journal of Solids and Structures
Record number
446101
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