Title of article
A study of CrNx thin films by X-ray photoelectron spectroscopy
Author/Authors
Emery، C. نويسنده , , Chourasia، A.R. نويسنده , , Yashar، P. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-90
From page
91
To page
0
Abstract
This paper presents an overview of how electron spectroscopies have contributed to advances in fullerene research. In particular, we illustrate the vital role these techniques have played in improving our understanding of the importance of strong electronic correlation and of electron-phonon coupling in these materials, in the derivation of electron hopping rates, in providing a direct determination of charge transfer and hybridisation in both fullerene salts and adsorbed fullerenes and in determining the optical gap of these systems. We discuss systems of increasing complexity, starting with C60 in the gas phase and in the solid state, and moving on to C60 salts and to C60 adsorbed on surfaces. Finally we look at both higher fullerenes and fullerenes with a heteroatom either on or inside the cage.
Keywords
Coatings , Chromium nitride , X-ray photoelectron spectroscopy , Auger parameter
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
1999
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
48233
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