Title of article :
Scanning tunneling microscope (STM) light emission spectroscopy of surface nanostructures
Author/Authors :
Ushioda، S. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-168
From page :
169
To page :
0
Abstract :
We present an overview of the experimental method and physical principles of scanning tunneling microscope (STM) light emission spectroscopy (STM-LES). By this new spectroscopic technique one can obtain the optical emission spectra of specific and individual surface nanostructures that are imaged by the STM. This method has been used to investigate the electronic transitions in surface nanostructures such as the protrusions of porous Si, the quantum wells of a semiconductor, and the rows and valleys of the reconstructed Au(110) surface.
Keywords :
semiconductors , STM , Silicon clusters , STS
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year :
2000
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number :
48333
Link To Document :
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