Title of article :
Microscopy and spectroscopy of buried nanostructures
Author/Authors :
Meyer، Fred T. نويسنده , , K?nel، H. von نويسنده , , Klemenc، M. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
We present an overview of the experimental method and physical principles of scanning tunneling microscope (STM) light emission spectroscopy (STM-LES). By this new spectroscopic technique one can obtain the optical emission spectra of specific and individual surface nanostructures that are imaged by the STM. This method has been used to investigate the electronic transitions in surface nanostructures such as the protrusions of porous Si, the quantum wells of a semiconductor, and the rows and valleys of the reconstructed Au(110) surface.
Keywords :
Ballistic-electron-emission microscopy , Scanning-tunneling spectroscopy , Strain , POINT DEFECTS , quantum dots
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA