Title of article :
Instrumentation for soft X-ray emission spectroscopy
Author/Authors :
Nordgren، Joseph نويسنده , , Guo، Jinghua نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
0
From page :
1
To page :
0
Abstract :
An account is presented of developments in instrumentation for soft X-ray emission spectroscopy (SXES) based on synchrotron radiation. An account for grating spectrometers for soft X-ray emission spectroscopy is given, and some considerations regarding synchrotron radiation applications of the spectroscopy are presented. A few points that relate to the new features of resonant SXES and polarization dependent studies are discussed in some detail. A brief discussion on future developments in SXES instrumentation is included.
Keywords :
Scanning tunnelling microscopy , Scanning tunnelling spectroscopy , copper , Quantum wells , interference , Aluminium
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year :
2000
Journal title :
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number :
48344
Link To Document :
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