Title of article
Instrumentation for soft X-ray emission spectroscopy
Author/Authors
Nordgren، Joseph نويسنده , , Guo، Jinghua نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
0
From page
1
To page
0
Abstract
An account is presented of developments in instrumentation for soft X-ray emission spectroscopy (SXES) based on synchrotron radiation. An account for grating spectrometers for soft X-ray emission spectroscopy is given, and some considerations regarding synchrotron radiation applications of the spectroscopy are presented. A few points that relate to the new features of resonant SXES and polarization dependent studies are discussed in some detail. A brief discussion on future developments in SXES instrumentation is included.
Keywords
Scanning tunnelling microscopy , Scanning tunnelling spectroscopy , copper , Quantum wells , interference , Aluminium
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Serial Year
2000
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY & RELATED PHENOMENA
Record number
48344
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