Author/Authors :
Paolasini، L. نويسنده , , Matteo، S. Di نويسنده , , Vettier، C. نويسنده , , Bergevin، F. de نويسنده , , Sollier، A. نويسنده , , Neubeck، W. نويسنده , , Yakhou، F. نويسنده , , Metcalf، P. A. نويسنده , , Honig، J. M. نويسنده ,
Abstract :
Resonant X-ray scattering experiments have been performed in 2.8% Cr-doped V2O3 single crystal at the Vanadium K-photoabsorption edge. Using linear polarization analysis and comparing the angular dependence of scattered photons with structure factor calculations we can discriminate the nature of the different resonant X-ray processes involved in forbidden lattice reflections enhanced by resonances. We present an experimental method to extract information on local properties of edge-atom such as the anisotropy of the local atomic environment, the atomic magnetic moment orientation and orbital ordering.
Keywords :
fractal analysis , Particle morphology , Ultrafine , fine and coarse particle concentrators